Key facts
- Easy ICT test programme development via drag & drop
- Automated ICT creation based on CAD data
- Automated test point assignment
- Compatible with EGTSL / cTSVP from Rohde & Schwarz
- Fast and efficient test program execution
- Compensation of system residuals
Downloads
Options for creating the ICT test programme
Automatically with CAD data
the fastest way
Simply read in the CAD data and the test programme is created automatically. All that is required is:
- CAD layout (various formats possible)
- Circuit diagram
- Parts list / BoM
For this purpose, we use the proprietary software Testway Express from the renowned manufacturer Aster Technologies.
Drag & Drop
simply "click together" the test programme
Due to predefined test methods, components can be added easily and quickly via drag & drop.
The following measurements are possible via drag & drop:
- Discharge
- Short circuit / contact
- Connection
- Resistance
- Diode
- Transistor (bipolar)
- Capacitor (inductance | impedance)
- FET
- Optocoupler
- Z-diode
- Varistor
- Relay
- Shunt
